Ruibin Li
发表
Yan Liu,
Chaohui He,
Wei Chen,
2019,
Microelectronics Reliability.
Guizhen Wang,
Wei Chen,
Shan-chao Yang,
2019,
2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED).
Wei Chen,
Yan Liu,
Xiaoqiang Guo,
2019,
Chinese Physics B.
Guizhen Wang,
Wei Chen,
Yan Liu,
2019,
AIP Advances.
Chao Qi,
Xiaoming Jin,
Ruibin Li,
2023,
Microelectronics Reliability.
Yang Li,
Yonghong Li,
C. He,
2023,
IEEE Transactions on Nuclear Science.
Wei Chen,
Yang Li,
Yonghong Li,
2022,
IEEE Transactions on Nuclear Science.
Yang Li,
Yonghong Li,
C. He,
2022,
IEEE Transactions on Nuclear Science.