Qiujie Sun

Reverse-Bias Stress-Induced Electrical Parameters Instability in 4H-SiC JBS Diodes Terminated Nonequidistance FLRs

Yuming Zhang, Xiaoyan Tang, Qingwen Song, 2019, IEEE Transactions on Electron Devices.

Near-interface oxide traps in 4H–SiC MOS structures fabricated with and without annealing in NO*

Yuming Zhang, Xiaoyan Tang, Qingwen Song, 2017 .