Jinlan Li

Influence of deep defects on electrical properties of Ni/4H-SiC Schottky diode

P. Han, X. Ji, Yue Xu, 2019, Chinese Physics B.

Effect of Various Defects on 4H-SiC Schottky Diode Performance and Its Relation to Epitaxial Growth Conditions

P. Han, X. Ji, Feng Yan, 2020, Micromachines.

Investigation of a noise source and its impact on the photocurrent performance of long-wave-infrared InAs/GaSb type-II superlattice detectors.

P. Han, Xiaomu Wang, X. Ji, 2020, Optics express.