P.Mukherjee

LATTICE MISFIT MEASUREMENT IN INCONEL 625 BY X-RAY DIFFRACTION TECHNIQUE

S. Rai, S. Mahadevan, T.Jayakumar, 2006, cond-mat/0604222.

In situ XRD studies of the process dynamics during annealing in cold rolled copper

P.Mukherjee, S.Dey, N.Gayathri, 2015, 1508.01988.

LATTICE MISFIT MEASUREMENT IN INCONEL 625 BY X-RAY DIFFRACTION TECHNIQUE

S. Rai, S. Mahadevan, T.Jayakumar, 2006, cond-mat/0604222.