Farzad Zarrinfar

Method and device related to constitutable built-in type self-restoration of asic memory design

Owen S. Bair, Adam Kablanian, Charles Chuuku-Han Li, 1995 .

Economics of “design for test” to remain competitive in the 90s

Farzad Zarrinfar, 1994, J. Electron. Test..

A D&T Roundtable: Testing Mixed Logic and DRAM Chips

Yervant Zorian, Ian Burgess, T. W. Williams, 1998, IEEE Des. Test Comput..