F. Fruleux

Fully-depleted SOI process optimization for 60 nm CMOS transistors

T. Skotnicki, R. Palla, B. Giffard, 2003, 2003 IEEE International Conference on SOI.

Gate-induced floating-body effect in fully-depleted SOI MOSFETs with tunneling oxide and back-gate biasing

G. Reimbold, Claire Fenouillet-Beranger, Sorin Cristoloveanu, 2004 .