Steven M. Domer

Component level yield/cost model for predicting VLSI manufacturability on designs using mixed technologies, circuitry, and redundancy

Steven M. Domer, S. A. Foertsch, G. D. Raskin, 1994, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94.

Model for yield and manufacturing prediction on VLSI designs for advanced technologies, mixed circuitry, and memories

Steven M. Domer, S. A. Foertsch, G. D. Raskin, 1995 .