Ganesh Srinivasan

发表

Online RF Checkers for Diagnosing Multi-Gigahertz Automatic Test Boards on Low Cost ATE Platforms

Abhijit Chatterjee, Friedrich Taenzler, Ganesh Srinivasan, 2006, Proceedings of the Design Automation & Test in Europe Conference.

On-line error detection in wireless RF transmitters using real-time streaming data

Abhijit Chatterjee, Vishwanath Natarajan, Ganesh Srinivasan, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2010, IEEE Design & Test of Computers.

Reconfiguration for enhanced alternate test (REALTest) of analog circuits

Abhijit Chatterjee, Shalabh Goyal, Ganesh Srinivasan, 2004, 13th Asian Test Symposium.

Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2010, 2010 19th IEEE Asian Test Symposium.

System-level testing of RF transmitter specifications using optimized periodic bitstreams

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers

Abhijit Chatterjee, Friedrich Taenzler, Ganesh Srinivasan, 2008, IEEE Design & Test of Computers.

Optimized EVM Testing for IEEE 802.11a/n RF ICs

Sule Ozev, Erkan Acar, Friedrich Taenzler, 2008, 2008 IEEE International Test Conference.

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2005, J. Electron. Test..

Instruments and methods for high speed ciliary imaging

Ganesh Srinivasan, 2008 .

RADPro: Automatic RF analyzer and diagnostic program generation tool

Bruce C. Kim, Sukeshwar Kannan, Friedrich Taenzler, 2010, 2010 IEEE International Test Conference.

Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms

Friedrich Taenzler, Ganesh Srinivasan, Hui-Chuan Chao, 2008, 2008 IEEE International Test Conference.

Assessment of Choking Flow Models in RELAP5 for Flashing Flow Through Small Cracks

Jovica R. Riznic, Shripad T. Revankar, Ganesh Srinivasan, 2013 .

Offshore Small Modular Reactor (OSMR): An Innovative Plant Design for Societally Acceptable and Economically Attractive Nuclear Energy in a Post-Fukushima, Post-9/11 World

Neil E. Todreas, Jacopo Buongiorno, Michael W. Golay, 2014 .

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices

Abhijit Chatterjee, Pramodchandran N. Variyam, Ganesh Srinivasan, 2010, J. Electron. Test..

A system-level alternate test approach for specification test of RF transceivers in loopback mode

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2005, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design.

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2011, 2011 24th Internatioal Conference on VLSI Design.

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones

Abhijit Chatterjee, Vishwanath Natarajan, Shreyas Sen, 2012, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Efficient test strategy for TDMA power amplifiers using transient current measurements: uses and benefits

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers

Abhijit Chatterjee, C. P. Wang, Pramodchandran N. Variyam, 2005, European Test Symposium (ETS'05).

Test time reduction for ACPR measurement of wireless transceivers using periodic bit-stream sequences

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.