T. Ishida

Suppression of Auger deexcitation and temperature quenching of the Er-related 1.54 μm emission with an ultrathin oxide interlayer in an Er/SiO2/Si structure

R. Saito, Tadamasa Kimura, H. Isshiki, 2003 .

Study of the radiative and nonradiative processes of rare earth implanted semiconductors at low temperatures

R. Saito, H. Isshiki, T. Ishida, 2001 .

Preferential suppression of Auger energy backflow by separation of Er ions from carriers with a thin oxide interlayer in Er-doped porous silicon

R. Saito, Tadamasa Kimura, H. Isshiki, 2003 .