Chao-Wen Tzeng

Layout-Based Defect-Driven Diagnosis for Intracell Bridging Defects

Shi-Yu Huang, Chao-Wen Tzeng, H. Cheng, 2009, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

A New Robust Paradigm for Diagnosing Hold-Time Faults in Scan Chains

Shi-Yu Huang, Chao-Wen Tzeng, J.-J. Hsu, 2006, 2006 International Symposium on VLSI Design, Automation and Test.

A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

Shi-Yu Huang, Chao-Wen Tzeng, Jheng-Syun Yang, 2008, TODE.

Split-Masking: An Output Masking Scheme for Effective Compound Defect Diagnosis in Scan Architecture With Test Compression

Shi-Yu Huang, Chao-Wen Tzeng, Shi-Yu Huang, 2010, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.