Halil Kukner

BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

Rudy Lauwereins, Liesbet Van der Perre, Francky Catthoor, 2014 .

Optimizing memory BIST Address Generator implementations

Said Hamdioui, Halil Kukner, Ad J. van de Goor, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).