Adam U. Kareem

Characterization of surface stiffness and probe–sample dissipation using the band excitation method of atomic force microscopy: a numerical analysis

S. Solares, Adam U. Kareem, 2012, Nanotechnology.

Utilization of simple scaling laws for modulating tip-sample peak forces in atomic force microscopy characterization in liquid environments

S. Solares, Joonil Seog, Adam U. Kareem, 2011 .