A. Hoffmann

Characterizing effects of radiation on forward and reverse saturation characteristics of n-channel devices [SRAMs]

S. Kerns, R. Lawrence, M.N. Jaafar Ali, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

Overview of the impact of downscaling technology on 1/f noise in p-MOSFETs to 90 nm

A. Hoffmann, D. Sodini, A. Laigle, 2004 .

Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise

F. Roy, A. Hoffmann, M. Valenza, 2006, 2006 International Caribbean Conference on Devices, Circuits and Systems.

Low frequency noise measurements of advanced BiCMOS SiGeC Heterojunction Bipolar Transistors used for mm-Wave to terahertz applications

P. Chevalier, D. Gloria, S. Haendler, 2013, 2013 22nd International Conference on Noise and Fluctuations (ICNF).

Improvement of 1/f noise in advanced 0.13 µm BiCMOS SiGe:C Heterojunction Bipolar Transistors

S. Haendler, G. Morin, A. Hoffmann, 2011, 2011 21st International Conference on Noise and Fluctuations.

PHOTON GENERATION BY SILICON DIODES IN AVALANCHE BREAKDOWN

S. E. Kerns, D. V. Kerns, A. Hoffmann, 1998 .