S. Klepeis

A Grinding/Polishing Tool for TEM Sample Preparation

J. Benedict, S. Klepeis, Ron Anderson, 1987 .

A New Tripod Polisher Method For Preparing Tem Specimens of Particles and Fibers

S. Klepeis, Ron Arlderson, 1997 .

A Procedure for Cross Sectioning Specific Semiconductor Devices for Both SEM and TEM Analysis

J. Benedict, M. Chaker, S. Klepeis, 1990 .

Recent Developments in the use of the Tripod Polisher for TEM Specimen Preparation

J. Benedict, S. Klepeis, R. Anderson, 1991 .

Combined Tripod Polishing and Fib Method for Preparing Semiconductor Plan View Specimens

S. Klepeis, R. Anderson, 1997 .

Preparation of Tem Plan View Sections on Specific Devices Using the Tripod Polisher

J. Benedict, S. Klepeis, R. Anderson, 1998 .