Sun-Ho Oh

Decrease of Parasitic Capacitance for Improvement of RF Performance of Multi-finger MOSFETs in 90-nm CMOS Technology

Choul-Young Kim, Jin-Woong Jeong, Sung-Kyu Kwon, 2015 .

Effect of fluorine implantation on recovery characteristics of p-channel MOSFET after negative bias temperature instability stress

H. Lee, Ga-Won Lee, Sungkyu Kwon, 2014 .

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

H. Lee, Ga-Won Lee, Hyeong-Sub Song, 2018, IEEE Journal of the Electron Devices Society.

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Byoung Hun Lee, Sung-Kyu Kwon, Sun-Ho Oh, 2014, IEEE Transactions on Electron Devices.

Comparative Analysis of Channel Length Dependence of NBTI and CHC Characteristics in PMOSFETs

H. Lee, Ga-Won Lee, Sungkyu Kwon, 2014 .