Donald K. Cohen

Development of the Methodology for 3-D Characterization of Oil Seal Shaft Surfaces

Mark Shuster, Dana Combs, Jim Pillar, 2002 .

Experimental study of phase-shifting mask defect detection using phase-shifting interferometry

Martin G. Cohen, Kuo-Ching Liu, Donald K. Cohen, 1994, Advanced Lithography.

Dynamic Testing Of Optical Disk Profile

Donald K. Cohen, Julian Lewkowicz, 1983, Other Conferences.

Interferometric measurement of etch depths in phase-shift masks

Qi-De Qian, Giang T. Dao, Donald K. Cohen, 1993, Advanced Lithography.

Optical profiling quantifies wear

Donald K. Cohen, Mike Zecchino, 2005 .

Techniques for measuring 1-μm diam Gaussian beams

Donald K. Cohen, Frank Luecke, D. Cohen, 1984 .