S. Ahn

Determination of spherical grain size from the average area of intersection in Ostwald ripening

D. Yoon, S. Kang, S. Ahn, 1981 .

Deposition and Electrical Characterization of Very Thin SrTiO3 Films for Ultra Large Scale Integrated Dynamic Random Access Memory Application

Ho-Kyu Kang, C. Hwang, C. Kang, 1995 .

Thermally robust Ta/sub 2/O/sub 5/ capacitor for the 256-Mbit DRAM

Kee-Won Kwon, Ho-Kyu Kang, Sung Tae Ahn, 1996 .

Microstructure and Electrical Properties of Tantalum Oxide Thin Film Prepared by Electron Cyclotron Resonance Plasma-Enhanced Chemical Vapor Deposition

Won-Jong Lee, Jeong Yong Lee, Il Kim, 1994 .

X-Ray Photoelectron Spectroscopy Studies of Titanium Nitride Barrier Metals Prepared by Low-Pressure Metalorganic Chemical Vapor Deposition

S. Paek, Y. H. Chang, S. Won, 1995 .

Al-Reflow Process with a “Cap-Clamp” for Sub-Micron Contact Holes

I. Park, Chang-Soo Park, G. Choi, 1995 .