D. B. Krakauer

ESD protection in a 3.3 V sub-micron silicided CMOS technology

D. B. Krakauer, 1993 .

ESD protection for mixed-voltage I/O using NMOS transistors stacked in a cascode configuration

D. B. Krakauer, Warren R. Anderson, 1998 .

An in-process monitor for n-channel MOSFET hot carrier lifetimes

B. S. Doyle, D. B. Krakauer, K. R. Mistry, 1992, 30th Annual Proceedings Reliability Physics 1992.

Examination of oxide damage during high-current stress of n-MOS transistors

B. S. Doyle, D. B. Krakauer, K. R. Mistry, 1993 .