L. Chang

发表

Observations of Segregation of Al in AlGaN Alloys

S. Lai, J. Kai, L. Chang, 2001 .

Extension of HRTEM resolution by semi-blind deconvolution method and Gerchberg-Saxton algorithm: application to grain boundary and interface.

J. Kai, L. Chang, F. Chen, 2001, Journal of electron microscopy.

Observations of Al segregation around dislocations in AlGaN

S. Lai, J. Kai, L. Chang, 2001 .

Four-Dimensional Dielectric Property Imaging of Low-K Materials for Copper Metallization Using Electron Spectroscopic Imaging Series

Fusen E. Chen, S. Lo, F. Chen, 2001, Microscopy and Microanalysis.

Structure of Σ7 grain boundary in Al2O3

Fu-Rong Chen, C. Chu, Chiu-Yen Wang, 1994 .

Segregation of Bismuth to Triple Junctions in Copper

K. Yin, T. Hsieh, A. H. King, 1997, Microscopy and Microanalysis.

High-resolution electron microscopy of Cu/MgO and Pd/MgO interfaces

Fu-Rong Chen, L. Chang, S. Chiou, 1994 .

Four-dimensional dielectric property image obtained from electron spectroscopic imaging series.

S. Lo, J. Kai, F. Chen, 2001, Journal of electron microscopy.

Improvement of resolution by maximum entropy linear image restoration for NiSi2/Si interface

Fu-Rong Chen, J. Y. Wang, Fu-Rong Chen, 1999 .