R. Salik

Impact of dielectrics and metals properties on electrical performances of advanced on-chip interconnects

A. Farcy, C. Bermond, B. Fléchet, 2002, Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519).

Performance Characterization of Advanced Interconnects on High Speed VLSI Circuits

C. Bermond, B. Fléchet, Y. Morand, 2000, 30th European Solid-State Device Research Conference.