G. Syaranamual

发表

The disparity of corrosion resistance between Ni/Au and Ni–P/Au electrical contacts in mixed flowing and salt spray tests

Yizhong Huang, Zhong Chen, V. Murugan, 2017, Journal of Materials Science.

An investigation into different nickel and nickel–phosphorus stacked thin coatings for the corrosion protection of electrical contacts

C. Gan, Yizhong Huang, Zhong Chen, 2016 .

On-state reliability study of AlGaN/GaN high electron mobility transistor on silicon

G. Syaranamual, 2018 .

Light-Emitting V-Pits: An Alternative Approach toward Luminescent Indium-Rich InGaN Quantum Dots

E. Fitzgerald, S. Pennycook, S. Gradečak, 2021, ACS Photonics.

Effectiveness of InGaAs/GaAs superlattice dislocation filter layers epitaxially grown on 200 mm Si wafers with and without Ge buffers

E. Fitzgerald, S. Pennycook, S. Gradečak, 2020, Semiconductor Science and Technology.

Strain-enabled ultra-broadband Ge-based photonic devices for low-cost integration in PICs

C. S. Tan, J. Michel, L. Kimerling, 2020 .

Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts

Zhong Chen, Vinod K. Murugan, Zhigang Jia, 2016, Microelectron. Reliab..

PIC-integrable, uniformly 056%-tensile strained Ge-on-insulator photodiodes enabled by recessed SiNx stressor

C. S. Tan, J. Michel, L. Kimerling, 2021, Photonics Research.

Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation

Govindo J. Syaranamual, Chee Lip Gan, Riko I. Made, 2016, Microelectron. Reliab..

Characterisation of defects generated during constant current InGaN-on-silicon LED operation

Yu Gao, Govindo J. Syaranamual, Chee Lip Gan, 2017, Microelectron. Reliab..

Atomic-Scale Characterization of Extended Defects in Wurtzite GaN Heterostructures

S. Pennycook, S. Gradečak, J. Chung, 2023, ACS Applied Nano Materials.

Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation

Govindo J. Syaranamual, Chee Lip Gan, Riko I. Made, 2017, Microelectron. Reliab..

Unlocking the origin of compositional fluctuations in InGaN light emitting diodes

L. Jones, S. Pennycook, S. Gradečak, 2021, 2102.03590.