Q. Jin

A method of using Si L-edge for O/Si and N/Si quantitative ratio analysis by electron energy loss spectroscopy (EELS).

Yun‐yu Wang, Sook Fun Chan, Q. Jin, 2021, Micron.

Comparing three quantification methods on N/Si ratio analysis using electron energy loss spectroscopy (EELS).

Shixin Wang, Sook Fun Chan, Q. Jin, 2022, Micron.

Investigation on leakage cause of 13Cr pipe flange used for a Christmas tree in a high-pressure and high-temperature gas well

Yujie Fan, Mifeng Zhao, Gang Wu, 2022, Engineering Failure Analysis.

Study on corrosion behavior of 13Cr gate valve using weld deposited gate and seat in well operation environments

Jun-feng Xie, Gang Chen, Yujie Fan, 2023, Engineering Failure Analysis.

Investigation of Diffraction Condition and Convergent Probe Effects on Inelastic Mean Free Path Determination by Using a Cone-Shaped Silicon Crystal

Q. Jin, S. Wang, 2006, Microscopy and Microanalysis.

Chang’E‐4 Rover Spectra Revealing Micro‐scale Surface Thermophysical Properties of the Moon

J. Vincent, E. Kührt, M. Grott, 2021, Geophysical Research Letters.

Internal Electric Field Profiling of 2D P-N Junctions of Semiconductor Devices by 4D STEM and Dual Lens Electron Holography

Zhouguang Wang, Shixin Wang, R. Yuan, 2022, Microscopy Today.