Zhuying Zhou

发表

Hydrogen depth profiling in solids: A comparison of several resonant nuclear reaction techniques

T. Tombrello, F. Xiong, F. Rauch, 1987 .

Depth profiling of hydrogen in thin films with the elastic recoil detection technique

Zhuying Zhou, Huanling Cheng, Fujia Yang, 1983 .

Measured stopping powers for 1–6 MeV 7Li ions in C, Al, Cu, Ag, Au and Pb foils and in a thin Si crystal

Zhuying Zhou, Fujia Yang, Zhong Li, 1996 .

Optical effects of buried conductive layers formed by MeV ion implantation

S. Zou, Yuehui Yu, Zhuying Zhou, 1994 .

Helium-Charged La-Ni-Al Thin Films Deposited by Magnetron Sputtering

Demin Chen, Liqun Shi, Shilin Xu, 2005 .

Helium-charged titanium films deposited by direct current magnetron sputtering

Liqun Shi, Shilin Xu, Chao-zhuo Liu, 2005 .

Cross sections for 165° backscattering of 2.0–9.0 MeV 4He ions from nitrogen

Ye Feng, Zhuying Zhou, Fujia Yang, 1994 .

Cross sections for 165° backscattering of 2.0–9.0 MeV 4He from carbon

Ye Feng, Zhuying Zhou, Yingyao Zhou, 1994 .

Excitation function and angular distribution for the 14N(α,p)17O reaction

Huizhong Xu, Liqun Shi, Zhuying Zhou, 1999 .

Simultaneous analysis of light elements using non-Rutherford helium backscattering

W. Xu, Zhuying Zhou, Fujia Yang, 1995 .

MeV ion beam mixing of Au/Si and Au/Ge systems

Zhuying Zhou, Yue-Hua Ren, Guo-qing Zhao, 1990 .

Lifetime measurement of the 28Si compound state at 13.095 MeV by the blocking effect

Y. H. Ren, X. Wu, Zhuying Zhou, 1987 .

Proton elastic scattering cross sections of titanium from 1.0 to 3.0 MeV at the laboratory angle of 151

Liqun Shi, Jie Zhang, Zhuying Zhou, 2004 .

Development from Rutherford backscattering to high energy backscattering spectrometry

Zhuying Zhou, Fujia Yang, Huansheng Cheng, 1997 .

Theoretical study on the role of bound electron in backward secondary electron emission induced by He+ incident on solid surfaces

Q. Lu, Zhuying Zhou, Guo-qing Zhao, 2002 .