William E. Boxford

发表

MEMS-Based Nanospray-Ionization

R. Syms, S. Wright, R. Moseley, 2010 .

New insights into dianion–cation contact ion-pairs: understanding the effect of cation complexation on the electron detachment and ionic fragmentation pathways of multiply charged anions

R. Burke, C. Dessent, William E. Boxford, 2007 .

Characterizing the intrinsic stability of gas-phase clusters of transition metal complex dianions with alkali metal counterions: counterion perturbation of multiply charged anions.

R. Burke, C. Dessent, William E. Boxford, 2007, The Journal of chemical physics.

Counter-ion perturbation of the fragmentation pathways of multiply charged anions: evidence for exit channel complexes on the fragmentation potential energy surfaces.

R. Burke, C. Dessent, William E. Boxford, 2006, The Journal of chemical physics.

Probing the intrinsic features and environmental stabilization of multiply charged anions.

C. Dessent, William E. Boxford, 2006, Physical chemistry chemical physics : PCCP.

High-energy collision induced dissociation of iridium hexa-halide dianions: Observation of triple electron detachment and other decay pathways

S. Nielsen, C. Dessent, William E. Boxford, 2005 .

On the propensity for electron transfer in high-energy collisions of iridium complex anions with cesium atoms

S. Nielsen, R. Burke, S. Panja, 2007 .

Ionic fragmentation versus electron detachment in isolated transition metal complex dianions

C. Dessent, J. Pearce, William E. Boxford, 2004 .

On the stability of IrCl6(3-) and other triply charged anions: solvent stabilization versus ionic fragmentation and electron detachment for the IrCl6(3-).(H2O)n n = 0-10 microsolvated clusters.

C. Dessent, William E. Boxford, 2005, The journal of physical chemistry. A.

Stabilization of excess charge in isolated adenosine 5'-triphosphate and adenosine 5'-diphosphate multiply and singly charged anions.

R. Burke, C. Dessent, A. Bruckmann, 2005, The journal of physical chemistry. A.

MEMS-Based Nanospray-Ionization Mass Spectrometer

R. Syms, S. Wright, R. Moseley, 2010, Journal of Microelectromechanical Systems.