Jitao Zhang

发表

Mixed polarization in determining the film thickness of a silicon sphere by spectroscopic ellipsometry

Xuejian Wu, Yan Li, Jitao Zhang, 2012 .

Design and performance of an absolute gas refractometer based on a synthetic pseudo-wavelength method.

Haoyun Wei, Yan Li, Jitao Zhang, 2012, Applied optics.

Falling liquid film thickness measurement by an optical-electronic method

B. Wang, Jitao Zhang, Xiao-feng Peng, 2000 .

The Impact of Environmental Information Disclosure on Water Quality

Yongliang Yang, Yi Li, Xin Zhang, 2022, Polish Journal of Environmental Studies.

Interferometric diameter determination of a silicon sphere using a traceable single laser frequency synthesizer

Haoyun Wei, Xuejian Wu, Yan Li, 2013 .

Phase-shifting interferometer using a frequency-tunable diode laser calibrated by an optical frequency comb.

Haoyun Wei, Xuejian Wu, Yan Li, 2012, The Review of scientific instruments.

Note: Real-time absolute air refractometer.

Haoyun Wei, Yan Li, Jitao Zhang, 2014, The Review of scientific instruments.

Determining mean thickness of the oxide layer by mapping the surface of a silicon sphere.

Zhiyong Luo, Haoyun Wei, Xuejian Wu, 2010, Optics express.

Interferometric determination of the silicon sphere diameter using a laser frequency tuning system calibrated by a Fabry-Perot cavity

Yan Li, Haoyun Wei, Jitao Zhang, 2012, Photonics Asia.