Ted Lundquist
发表
Rudolf Schlangen,
Christian Boit,
Uwe Kerst,
2007,
Microelectron. Reliab..
Bruce Cory,
Steven Kasapi,
Ted Lundquist,
2011,
Microelectron. Reliab..
Christian Boit,
Philipp Scholz,
Uwe Kerst,
2010,
Microelectron. Reliab..
Franco Stellari,
Alan J. Weger,
Peilin Song,
2015,
2015 IEEE International Reliability Physics Symposium.
Christian Boit,
Philipp Scholz,
Uwe Kerst,
2014,
Microelectron. Reliab..
Ted Lundquist,
E. Delenia,
J. Harroun,
2001,
Microelectron. Reliab..
Romain Desplats,
Ketan Shah,
Philippe Perdu,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Joy Y. Liao,
Howard L. Marks,
Steven Kasapi,
2009,
Microelectron. Reliab..
Rudolf Schlangen,
Christian Boit,
Uwe Kerst,
2007,
2007 IEEE International Test Conference.
Rudolf Schlangen,
S. Li,
K. Yu,
2010,
Microelectron. Reliab..
Ted Lundquist,
Hervé Deslandes,
H. Deslandes,
2003,
Microelectron. Reliab..
Rudolf Schlangen,
Christian Boit,
Uwe Kerst,
2009,
Microelectron. Reliab..
Steven Kasapi,
Ted Lundquist,
Keneth R. Wilsher,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Madhumita Sengupta,
Mark Thompson,
Ted Lundquist,
2002,
IS&T/SPIE Electronic Imaging.
Bill Thompson,
Ted Lundquist,
Chun-Cheng Tsao,
2002,
Microelectron. Reliab..
Rudolf Schlangen,
Uwe Kerst,
Ted Lundquist,
2005,
IEEE International Conference on Test, 2005..
Tom Crawford,
P. Vedagarbha,
Ted Lundquist,
2016,
2016 Conference on Lasers and Electro-Optics (CLEO).
Rudolf Schlangen,
Christian Boit,
Uwe Kerst,
2008,
IEEE Design & Test of Computers.
Rudolf Schlangen,
C. Boit,
Ted Lundquist,
2009,
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.