S. Goh

Improving dynamic Optical Beam Induced Resistance Change Methods for defect isolation

M. Thor, B. Yeoh, S. Goh, 2020, 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping

M. Thor, B. Yeoh, S. Goh, 2019, 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Hao Hu, Lin Zhao, S. H. Goh, 2019, Microelectronics Reliability.

Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks

Hao Hu, Lin Zhao, Jeffrey Lam, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).