D. Nagalingam

Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

J.C.H. Phang, D. Nagalingam, C. S. Bhatia, 2011 .

Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect

Jeffrey Lam, C. Q. Chen, G. B. Ang, 2017, Microelectron. Reliab..

Fault isolation on the wafer with lithography hotspot signature

C. Q. Chen, J. Lam, Francis Rivai, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance

C. S. Bhatia, M. Steiner, Y.H. Kim, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

Failure analysis on 14 nm FinFET devices with ESD CDM failure

Pik Kee Tan, Yuzhe Zhao, Zhihong Mai, 2018, Microelectron. Reliab..

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

J.C.H. Phang, D. Nagalingam, C. S. Bhatia, 2010, 2010 IEEE International Reliability Physics Symposium.

Defect Prediction Approach to enhance Static Fault Localization of Functional Logic Failure Defects using NIR Photon Emission Microscopy

S. L. Ting, A. Quah, S. Neo, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).