S. Beuer

UV nanoimprint lithography process optimization for electron device manufacturing on nanosized scale

H. Ryssel, M. Rommel, A. Bauer, 2009 .

Comparison of silicon and 4H silicon carbide patterning using focused ion beams

L. Frey, M. Rommel, J. Michler, 2015 .

Via Size-Dependent Properties of TiAl Ohmic Contacts on 4H-SiC

M. Rommel, T. Erlbacher, S. Beuer, 2022, Materials Science Forum.

Comprehensive study of focused ion beam induced lateral damage in silicon by scanning probe microscopy techniques

L. Frey, V. Yanev, M. Rommel, 2010 .

Novel approach based on continuous trench modelling to predict focused ion beam prepared freeform surfaces

J. Billingham, D. Axinte, M. Rommel, 2018 .

Accurate parameter extraction for the simulation of direct structuring by ion beams

H. Ryssel, M. Rommel, A. Bauer, 2007 .

Intragranular Thermal Fatigue of Cu Thin Films: Near-Grain Boundary Hardening, Strain Localization and Voiding

C. Yildirim, I. Greving, C. Detlefs, 2023, Acta Materialia.

Multiscale morphological analysis of bone microarchitecture around Mg-10Gd implants

I. Greving, Olga Will, S. Flenner, 2023, Bioactive materials.

Active Fuse

H. Ryssel, M. Marz, A.J. Bauer, 2006, 2006 IEEE International Symposium on Power Semiconductor Devices and IC's.

A Modeling of 4H-SiC Super-Junction MOSFETs with Filtered High Energy Implantation

S. Koo, T. Erlbacher, Dong-Wook Byun, 2023, Key Engineering Materials.