S. Kraeusel

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, Semiconductor Science and Technology.

Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films

M. Kneissl, M. Weyers, Tao Wang, 2019, Photonics Research.

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, IOP Conference Series: Materials Science and Engineering.

Electron channeling contrast imaging studies of nonpolar nitrides using a scanning electron microscope

A. Vescan, K. Wang, B. Hourahine, 2013 .

Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN

C. Humphreys, B. Hourahine, R. Martin, 2013, Microscopy and Microanalysis.

Defect evolution and interplay in n-type InN

France., Usa, UK., 2011, 1111.5186.

Global search for stable screw dislocation cores in III‐N semiconductors

B. Hourahine, S. Kraeusel, 2012 .