R. McDermott

Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, Semiconductor Science and Technology.

Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope

M. Kneissl, M. Weyers, P. Parbrook, 2020, IOP Conference Series: Materials Science and Engineering.