H. Pulker

Improvements in film quality through progress in vacuum generation and deposition technology

H. Pulker, 1979 .

Applications of Quartz Crystal Microbalances for Thin Film Deposition Process Control

H. Pulker, J. P. Décosterd, 1984 .

Properties of ZnS Films Evaporated in High Vacuum

A. Preisinger, H. Pulker, 1974 .

Factors influencing the accuracy of a quartz-crystal oscillator as a thickness monitor for thin-film deposition

H. Pulker, W. Schädler, 1968 .

Morphology and light scattering of dielectric multilayer systems

K. Guenther, H. Pulker, H. Gruber, 1976 .

[Simple interference interchangable objective for the microscope for the determination of thickness according to Fizeau-Tolansky].

H. Pulker, 1966, Die Naturwissenschaften.

Electron microscopic investigations of cross sections of optical thin films.

K. Guenther, K H Guenther, H K Pulker, 1976, Applied optics.