J. E. Purviance

A sensitivity figure for yield improvement (manufacturable microwave circuit design)

J. E. Purviance, M. D. Meehan, 1988 .

Statistical circuit design for yield improvement in CMOS circuits

J. E. Purviance, S. R. Whitaker, H. J. Kamath, 1990 .

An efficient linear statistical FET model

C. Potratz, J. E. Purviance, M. C. Petzold, 1989, IEEE MTT-S International Microwave Symposium Digest.

Potential utilities of optimal estimation and control in nuclear power plants

J. L. Tylee, J. E. Purviance, 1983 .

High-yield narrow-band matching structures

J. E. Purviance, D. H. Monteith, 1988 .

Yield sensitivity of HEMT circuits to process parameter variations

J. E. Purviance, J. C. Sarker, 1992 .

A linear statistical FET model using principal component analysis

J. E. Purviance, C. Potratz, M. C. Petzold, 1989 .