L. Zullino

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress

Sergey Bychikhin, Dionyz Pogany, Erich Gornik, 2003, Microelectron. Reliab..

Characterization and modeling of transient device behavior under CDM ESD stress

G. Groeseneken, H. Gieser, M. Etherton, 2004, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Study of CDM specific effects for a smart power input protection structure

Wolfgang Wilkening, Ning Qu, Horst A. Gieser, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

Analysis of the triggering behavior of low voltage BCD single and multi-finger gc-NMOS ESD protection devices

V. Dubec, G. Meneghesso, A. Tazzoli, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions

Dionyz Pogany, Erich Gornik, M. Blaho, 2002, Microelectron. Reliab..

Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress

M. Blaho, L. Zullino, A. Andreini, 2004, IEEE Transactions on Device and Materials Reliability.

Surface mobility in silicon at large operating temperature

W. Fichtner, L. Colalongo, Giorgio Baccarani, 2002, International Conferencre on Simulation of Semiconductor Processes and Devices.

Electron and hole mobility in silicon at large operating temperatures. I. Bulk mobility

Wolfgang Fichtner, L. Colalongo, Massimo Rudan, 2002 .

Impact-ionization in silicon at large operating temperature

Massimo Rudan, Giorgio Baccarani, L. Zullino, 1999, 1999 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD'99 (IEEE Cat. No.99TH8387).