G. Wiener

发表

Silicon surface metal contamination measurements using grazing-emission XRF spectrometry

M. Heyns, S. Gendt, P. Mertens, 1997 .

Characterization of titanium nitride layers by grazing-emission X-ray fluorescence spectrometry

P. K. D. Bokx, G. Wiener, S. Kidd, 1998 .

Thin-layer chromatography: A laboratory handbook

G. Wiener, 1966 .

Thin-layer chromatography

G. Wiener, 1964 .

Progress in thin layer chromatography and related methods. Vol. 1

G. Wiener, 1970 .

COMBINED NEUTRON SCATTERING, NEUTRON CAPTURE GAMMA RAY AND POSITRON ANNIHILATION STUDIES ON MATERIALS UNDER ELASTIC AND PLASTIC DEFORMATION

H. Priesmeyer, G. Wiener, C. Bittorf, 1992 .

Determination of concentration depth profiles using total‐reflection x‐ray fluorescence spectrometry in combination with ion‐beam etching

H. Schwenke, R. Günther, R. Bormann, 1996 .

Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry

H. Schwenke, R. Günther, C. Michaelsen, 1997 .

Concentration‐depth profiling using total‐reflection x‐ray fluorescence spectrometry in combination with ion‐beam microsectioning techniques

H. Schwenke, C. Michaelsen, R. Bormann, 1995 .

Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering

H. Schwenke, R. Günther, R. Bormann, 1997 .

Grazing-emission X-ray fluorescence spectrometry; principles and applications 1 This paper was prese

H. P. Urbach, C. Kok, G. Wiener, 1997 .