L. Fares

Picosecond laser micromachining prior to FIB milling for electronic microscopy sample preparation

M. Sentis, T. Sarnet, A. Corbin, 2017 .

Interfacial reactions in relation with adhesion failures in Al/TiN/Ti/SiO2 and Al/TiN/Ti/borophosphosilicate glass systems

C. Alfonso, A. Charaï, D. Gallet, 2003 .

Extraction of physical parameters on silicon nanocrystals devoted to non-volatile memories

C. Muller, D. Deleruyelle, E. Jalaguier, 2012, 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG).

Formation of C49-TiSi 2 in flash memories: a nucleation controlled phenomenon?

P. Albarède, F. Nemouchi, D. Mangelinck, 2003 .

Structural change induced on an atomie scale by equilibrium sulphur segregation in tilt germanium grain boundaries

O. H. Duparc, C. Alfonso, J. Rouviere, 2001 .

Optimized FIB silicon samples suitable for lattice parameters measurements by convergent beam electron diffraction.

C. Grosjean, C. Alfonso, A. Charaï, 2008, Micron.

Optimization of picosecond laser processing for microscopy sample preparation prior to Ion milling polishing

M. Sentis, T. Sarnet, A. Corbin, 2017, 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC).

Picosecond laser processing for fast cross sectioning and preparation of TEM lamella prior to ion milling polishing

T. Sarnet, A. Corbin, A. Sikora, 2017 .

Micromachining of semiconductor by femtosecond laser for integrated circuit defect analysis

M. Sentis, J. Hermann, P. Delaporte, 2007 .

Femtosecond laser micromachining of Integrated Circuits ( ICs ) for semiconductor defect analysis

M. Sentis, J. Hermann, P. Delaporte, 2007 .

Interfacial Modification Induced by Equilibrium Segregation in Ge(S) Bicrystal

C. Alfonso, J. Rouviere, A. Charaï, 1998 .