P. Roche

Automatic evaluation of optical constants and thickness of thin films: application to thin dielectric layers

B. Vidal, E. Pelletier, P. Roche, 1976 .

Characterizations of optical surfaces by measurement of scattering distribution.

E Pelletier, E. Pelletier, P Roche, 1984, Applied optics.

Determination of interface roughness cross-correlation properties of an optical coating from measurements of the angular scattering

F. Flory, E. Pelletier, P. Bousquet, 1984 .

Optical filters: Monitoring process allowing the auto-correction of thickness errors

R. Kowalczyk, E. Pelletier, P. Bousquet, 1972 .