K. Yeh

发表

Determination of Effective Density-of-States Using a Novel Schottky Barrier Poly-Si Thin-Film Transistor

Horng-Chih Lin, Tiao-Yuan Huang, Ming-Hsien Lee, 2005 .

A novel methodology for extracting effective density-of-states in poly-Si thin-film transistors

H. Lin, M. Lee, Shih-Wen Shen, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Schottky barrier thin-film transistor (SBTFT) with silicided source/drain and field-induced drain extension

H. Lin, T. Huang, C. Lin, 2001, IEEE Electron Device Letters.

Plasma-Induced Damage on the Performance and Reliability of Low-Temperature Polycrystalline Silicon Thin-Film Transistors

C. Chen, T. Lei, Jam-Wem Lee, 2007 .

Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Jam-Wem Lee, Po-Hao Lee, Shen-De Wang, 2006, IEEE Transactions on Electron Devices.

A novel thin-film transistor with self-aligned field induced drain

Horng-Chih Lin, Tiao-Yuan Huang, C. Lin, 2001, IEEE Electron Device Letters.

Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors

M. Ma, C. Chen, T. Lei, 2008, IEEE Electron Device Letters.

Bias Temperature Instabilities for Low-Temperature Polycrystalline Silicon Complementary Thin-Film Transistors

M. Ma, C. Chen, T. Lei, 2007 .

A Reliability Model for Low-Temperature Polycrystalline Silicon Thin-Film Transistors

M. Ma, C. Chen, T. Lei, 2007, IEEE Electron Device Letters.

Plasma Damage-Enhanced Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

C. Chen, T. Lei, Jam-Wem Lee, 2006, IEEE Electron Device Letters.

Ambipolar Schottky-barrier TFTs

S. Sze, Horng-Chih Lin, Ruo-Gu Huang, 2002 .