J. Fesquet

Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements

F. Saigné, F. Joffre, Olivier Quittard, 2002, Microelectron. Reliab..

Effects of input bias on different commercial technological lines of CMOS inverters with respect to the cumulated dose

J. Gasiot, J. Fesquet, L. Dusseau, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

Prediction of low dose-rate effects in power metal oxide semiconductor field effect transistors based on isochronal annealing measurements

Kenneth F. Galloway, Ronald D. Schrimpf, J. Fesquet, 1997 .

An integrated sensor using optically stimulated luminescence for in-flight dosimetry

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2000 .

Characterization of an integrated sensor using optically stimulated luminescence for in-flight dosimetry

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2002 .

Experimental determination of the frequency factor of thermal annealing processes in metal–oxide–semiconductor gate-oxide structures

Kenneth F. Galloway, Ronald D. Schrimpf, Robert Ecoffet, 1997 .

High energy electron dose-mapping using optically stimulated luminescent films

J. Gasiot, Laurent Dusseau, J. Fesquet, 1999 .

Experimental validation of an accelerated method of oxide-trap-level characterization for predicting long term thermal effects in metal oxide semiconductor devices

Ronald D. Schrimpf, J. Gasiot, J. P. David, 1997 .

Prediction of the one-year thermal annealing of irradiated commercial devices based on experimental isochronal curves

F. Saigne, Ronald D. Schrimpf, Robert Ecoffet, 2000 .

Experimental procedure to predict the competition between the degradation induced by irradiation and thermal annealing of oxide trapped charge in MOSFETs

F. Saigne, Ronald D. Schrimpf, Robert Ecoffet, 2000 .

Analysis of the proton-induced permanent degradation in an optocoupler

Robert Ecoffet, J. Gasiot, Laurent Dusseau, 2002 .

Effect of switching from high to low dose rate on linear bipolar technology radiation response

F. Saigne, J. Boch, J. Gasiot, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..