M. Ajaka

Characterization and Raman investigations on high-quality ZnO thin films fabricated by reactive electron beam evaporation technique

Y. Zaatar, G. Ferblantier, J. Sauvajol, 2005 .

Activation and diffusion during rapid thermal annealing of arsenic and boron implanted silicon

A. Slaoui, A. Grob, J. Grob, 1987 .

Characterization of the state of a droplet on a micro-textured silicon wafer using ultrasound

M. Harnois, V. Senez, R. Boukherroub, 2012 .

CALCULATIONS OF DIFFERENT PHYSICAL PARAMETERS BY 2 D SIMULATIONS OF THE ISING MODEL FOR DIFFERENT GEOMETRICAL LATTICES

J. Atanas, J. Bechara, M. Ajaka, 2012 .

Ellipsometric spectroscopy on polycrystalline CuIn1–xGaxSe2: Identification of optical transitions

M. Tahchi, C. Llinarés, M. Ajaka, 2005 .