Carl W. Reinhardt

Part II: The influence of substrate type, film thickness, and primary ion type on molecular weight characterization of linear polydimethyl siloxane films by secondary ion mass spectrometry

Kenneth L. Kearns, M. Pacholski, Joo H. Kang, 2020, Surface and Interface Analysis.

Topological Design of Highly Anisotropic Aligned Hole Transporting Molecular Bottlebrushes for Solution-Processed OLEDs.

Ashlee A. Jahnke, Thomas C. Fitzgibbons, A. Sokolov, 2022, Journal of the American Chemical Society.

Photocured Simultaneous and Sequential PDMS/PMMA Interpenetrating Polymer Networks

Shane L. Mangold, K. Shull, D. Eldred, 2022, Macromolecules.

Nanoscale Infrared Spectroscopy of Materials by Atomic Force Microscopy

C. Prater, K. Vodopyanov, W. King, 2010 .

Nanoscale chemical imaging of a deuterium-labeled polyolefin copolymer in a polyolefin blend by atomic force microscopy-infrared spectroscopy

Brian M. Habersberger, G. Meyers, Carl W. Reinhardt, 2017 .

Damage and repair of organic and inorganic surfaces by Ar+ ion and gas cluster ion beam sputtering

Carl W. Reinhardt, D. Yancey, 2018, Journal of Electron Spectroscopy and Related Phenomena.

Semi-quantitative AFM-IR Analysis of Chemical Gradients in Silicone Optical Waveguides.

Brandon W. Swatowski, G. Meyers, W. Weidner, 2020, ACS applied materials & interfaces.

Semiquantitative Atomic Force Microscopy-Infrared Spectroscopy Analysis of Chemical Gradients in Silicone Optical Waveguides

Brandon W. Swatowski, G. Meyers, W. Weidner, 2020 .