J. Ewald

The two criteria diagram for creep crack initiation and its application to an ip-turbine

J. Ewald, S. Sheng, 1998 .

Optical properties and electronic structure of the Cu–Zn brasses

Michael B. Cortie, Erich H. Kisi, Vicki J. Keast, 2015 .

Estimation of manufacturing defects in the creep range

K. Maile, J. Ewald, K.-H. Keienburg, 1985 .