T. Emoto

发表

Lattice distortion due to surface treatment of bias sputtering revealed by extremely asymmetric X-ray diffraction

H. Namita, K. Itagaki, K. Akimoto, 2004 .

Structural study of SiC(0 0 0 1)3×3 surface by surface X-ray diffraction

H. Kawata, Toshitake Takahashi, Xiaowei Zhang, 2003 .

Strain relaxation near high-k/Si interface by post-deposition annealing

T. Nabatame, A. Toriumi, A. Ichimiya, 2005 .

ELECTRON SCATTERING OFF SHORT-LIVED RADIOACTIVE NUCLEI

T. Shirai, H. Tongu, A. Noda, 2009 .

Characterization of ion beam induced nanostructures

B. Satpati, J. Ghatak, T. Som, 2006 .

Observation of the strain field near the Si(111) 7 x 7 surface with a new X-ray diffraction technique.

A. Ichimiya, K. Akimoto, T. Emoto, 1998, Journal of synchrotron radiation.

Neutron Capture Cross Section Measurements of Nb-93, I-127, Ho-165, Ta-181 and U-238 between 3.2 and 80keV

N. Yamamuro, Kimiaki Saito, Y. Fujita, 1980 .

First demonstration of electron scattering using a novel target developed for short-lived nuclei.

T. Shirai, H. Tongu, A. Noda, 2009, Physical review letters.

Novel internal target for electron scattering off unstable nuclei.

T. Shirai, H. Tongu, A. Noda, 2008, Physical review letters.

Electron scattering based on a novel internal target technique: SCRIT

H. Tongu, A. Noda, Y. Yano, 2009 .

Crystal Orientation of Silver Films on Silicon Surfaces Revealed by Surface X-Ray Diffraction

H. Kawata, Xiaowei Zhang, A. Ichimiya, 2003 .

Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction

K. Akimoto, T. Emoto, 2010, Journal of physics. Condensed matter : an Institute of Physics journal.

Strain due to nickel diffusion into hydrogen-terminated Si(1 1 1) surface

K. Hirose, A. Ichimiya, K. Akimoto, 2002 .

Strain evolution in Si substrate due to implantation of MeV ion observed by extremely asymmetric x-ray diffraction

J. Ghatak, K. Akimoto, P. V. Satyam, 2009 .

High-k Gate Dielectric Films Studied by Extremely Asymmetric X-ray Diffraction and X-ray Photoelectron Spectroscopy

K. Hirose, D. Kobayashi, K. Akimoto, 2007 .

Strain distribution due to ion implantation revealed by extremely asymmetric x-ray diffraction

J. Ghatak, K. Akimoto, P. V. Satyam, 2006 .

Lattice distortion near InGaP compound semiconductor surface due to surface treatment of bias sputtering

H. Namita, K. Itagaki, A. Ichimiya, 2003 .

Strain near SiO2 Si interface revealed by X-ray diffraction intensity enhancement

Y. Ishikawa, A. Ichimiya, K. Akimoto, 2000 .

Strain field observed at the SiO2/Si(111) interface

A. Ichimiya, K. Akimoto, T. Emoto, 1999 .

Interface reconstructed structure of Ag/Si( 1 1 1 ) revealed by X-ray diffraction

H. Kawata, W. Yashiro, Xiaowei Zhang, 2001 .

Quantitative evaluation of strain near reconstructed Si surfaces

A. Ichimiya, K. Akimoto, Y. Ishikawa, 2001 .

Soft X-ray emissions by highly charged ions on solid surfaces: Mo and Ta surfaces

A. Ichimiya, M. Sekiguchi, S. Ninomiya, 1996 .