V. Misra
发表
Y. H. Kim,
J. H. Lee,
R. Choi,
2004,
Microelectron. Reliab..
V. Misra,
N. Ramanan,
2011,
IEEE Electron Device Letters.
J. Farkas,
C. Lage,
J. Schmidt,
1998,
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).
V. Misra,
S. Sridevan,
J. Wortman,
1995,
IEEE Electron Device Letters.
V. Misra,
Huicai Zhong,
V. Misra,
2001,
2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
A simulation study to evaluate the feasibility of midgap workfunction metal gates in 25 nm bulk CMOS
V. Misra,
Kingsuk Maitra,
2003,
IEEE Electron Device Letters.
V. Misra,
V. Misra,
H. Lazar,
2002,
IEEE Electron Device Letters.
Xiangyu Yang,
V. Misra,
Bongmook Lee,
2012,
IEEE Electron Device Letters.
Y.H. Kim,
V. Misra,
R. Choi,
2004,
IEEE Electron Device Letters.
G. Ghibaudo,
T. Ouisse,
V. Misra,
1996,
IEEE Electron Device Letters.
Jae Hoon Lee,
B. Chen,
V. Misra,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
V. Misra,
V. Misra,
R. Jha,
2006,
IEEE Electron Device Letters.
V. Misra,
Jae-Hoon Lee,
V. Misra,
2003,
IEEE International Electron Devices Meeting 2003.
V. Misra,
G. Mathur,
S. Surthi,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
V. Misra,
Huicai Zhong,
You-Seok Suh,
2002,
Digest. International Electron Devices Meeting,.
S. Veeraraghavan,
N. Bhat,
V. Misra,
1998,
1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).