M. Muehlberger

Soft UV-NIL at the 12.5 nm scale

G. Kreindl, M. Kast, D. Treiblmayr, 2011, Advanced Lithography.

Life-Cycle Analysis: IDEA - An International Data Base for Ecoprofile Analysis. A Tool for Decision Makers

M. Muehlberger, B. Vallance, Y. Virtanen, 1991 .