Y. Fujiwara

发表

Cluster ion beam generation from a wetted needle emitter for organic secondary ion mass spectrometry (organic SIMS) using a protic ionic liquid, propylammonium nitrate.

N. Saito, Y. Fujiwara, 2018, Rapid communications in mass spectrometry : RCM.

High depth resolution SIMS analysis using metal cluster complex ion bombardment

M. Koike, H. Nonaka, S. Ichimura, 2008 .

Ion Beam Generation from an Electrolyte Solution Containing Polyatomic Cations and Anions for Secondary Ion Mass Spectrometry

H. Nonaka, S. Ichimura, A. Kurokawa, 2009 .

Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS)

H. Nonaka, S. Ichimura, A. Kurokawa, 2009 .

A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum

H. Nonaka, S. Ichimura, N. Saito, 2010 .

Time‐of‐Flight secondary ion mass spectrometry (TOF‐SIMS) using the metal‐cluster‐complex primary ion of Ir4(CO)7+

H. Nonaka, S. Ichimura, A. Kurokawa, 2011 .

Electrochemical Reactions of Ionic Liquid in Vacuum and Their Influence on Ion-Beam Production by Electrospray

Y. Fujiwara, 2020 .

Synthesis of endohedral-fullerenes using laser ablation plasma from solid material and vaporized fullerenes

Y. Ikehara, H. Sakakita, H. Itagaki, 2019, AIP Advances.

Cluster SIMS using metal cluster complex ions

H. Itoh, H. Nonaka, S. Ichimura, 2008 .

Characteristics of a cluster‐ion beam of Os3(CO)n+ (n = 7 or 8) for low‐damage sputtering

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Multiphoton ionization of metal cluster complexes Os3(CO)12 and Ir4(CO)12: Determination of the ionization energy and coordination energy of the complex ions

H. Nagai, H. Nonaka, A. Suzuki, 2008 .

Characteristics of a charged-droplet beam generated by vacuum electrospray of an ionic liquid

H. Nonaka, S. Ichimura, N. Saito, 2011 .

Ion beam generation from a protic ionic liquid source with an externally wetted tungsten needle

N. Saito, Y. Fujiwara, 2019 .

Time-of-flight secondary ion mass spectrometry using a new primary ion beam generated by vacuum electrospray of a protic ionic liquid, propylammonium nitrate.

N. Saito, Y. Fujiwara, 2017, Rapid communications in mass spectrometry : RCM.

Single molecular multianalyte sensor: jewel pendant ligand.

D. Citterio, M. Hagiwara, Koji Suzuki, 2005, Organic letters.

Stabilities and dissociation reactions of the Irm(CO)n+ ions observed in TOF-SIMS of Ir4(CO)12 thin layer

H. Nagai, H. Nonaka, N. Saito, 2013 .

An Oxygen Negative Ion Source of a New Concept Using Solid Oxide Electrolytes

J. Mizusaki, T. Kawada, Jeong-Oh Hong, 2003 .

Mass Markers for Time-of-Flight Secondary Ion Mass Spectrometry Spectrum in a Large Mass Region Using Ir4(CO)12 Metal Cluster Complex Sample

H. Nonaka, T. Fujimoto, N. Saito, 2010 .

Continuous emission of O− ions into a vacuum from a bare surface of yttria-stabilized zirconia at elevated temperatures

T. Sakai, J. Mizusaki, T. Kawada, 2006 .

Effect of Electrochemical Polarization on the Emission of O − Ions from the Surface of YSZ

T. Sakai, J. Mizusaki, T. Kawada, 2003 .

Emission characteristics of negative oxygen ions into vacuum from cerium oxide

H. Matsumoto, T. Sakai, J. Mizusaki, 2006 .

Emission Characteristics of O- Ions from a Bare Surface of Yttria-Stabilized Zirconia (YSZ) at Elevated Temperatures

J. Mizusaki, T. Kawada, Jeong-Oh Hong, 2002 .

Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

H. Nonaka, S. Ichimura, A. Kurokawa, 2008 .

Depth resolution improvement in secondary ion mass spectrometry analysis using metal cluster complex ion bombardment

M. Koike, H. Nonaka, S. Ichimura, 2006 .

Production and Applications of Metal-cluster-complex Ion Beams

H. Itoh, H. Nonaka, S. Ichimura, 2009 .

Effects of a proton-conducting ionic liquid on secondary ion formation in time-of-flight secondary ion mass spectrometry.

N. Saito, Y. Fujiwara, 2016, Rapid communications in mass spectrometry : RCM.

Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate

N. Saito, Y. Fujiwara, 2015 .

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using an ionic‐liquid primary ion beam source

N. Saito, Y. Fujiwara, 2014 .

Emission characteristics of a charged‐droplet beam source using vacuum electrospray of an ionic liquid

H. Nonaka, S. Ichimura, N. Saito, 2013 .

Component analysis of a mixed beam generated by vacuum electrospray of an ionic liquid

H. Nonaka, S. Ichimura, N. Saito, 2012 .

Beam Characteristics of Positively and Negatively Charged Droplets Generated by Vacuum Electrospray of an Ionic Liquid

H. Nonaka, S. Ichimura, N. Saito, 2012 .

Mass shift in the mass spectra of TOF-SIMS and the analysis of kinetic energies of the ions

H. Nagai, H. Nonaka, N. Saito, 2012 .

Effects of the temperature of a protic ionic liquid on ion beam production by vacuum electrospray

Y. Fujiwara, 2023, Journal of Vacuum Science & Technology B.

Negative ion beam bombardment of a protic ionic liquid: Alleviating surface charging and damage and analyzing the surface of organic insulating materials

Naoaki Saito, Y. Fujiwara, 2022, Journal of Vacuum Science & Technology A.

Negative-cluster ion beam production from the tip of a sharp needle: Suppression of surface charging and surface analysis of an insulated sample

Naoaki Saito, Y. Fujiwara, 2021, Journal of Vacuum Science and Technology.

Irradiation characteristics of metal-cluster-complex ions containing diverse multi-elements with large mass differences

H. Nonaka, S. Ichimura, A. Kurokawa, 2007 .

Secondary-Ion-Mass-Spectrometry Depth Profiling of Ultra-shallow Boron Delta Layers in Silicon with Massive Molecular Ion Beam of Ir4(CO)7+

H. Nonaka, S. Ichimura, A. Kurokawa, 2007 .

SIMS depth profile study using metal cluster complex ion bombardment

M. Koike, H. Nonaka, S. Ichimura, 2007 .

Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

H. Itoh, H. Nonaka, S. Ichimura, 2006 .

Ion-beam characteristics of the metal cluster complex of Ir4(CO)12

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Production of Stable Ion Beam of Os3(CO)12 with Compact Metal-Cluster-Complex Ion Source

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Beam-induced Nanoscale Ripple Formation on Silicon with the Metal-Cluster-Complex Ion of Ir4(CO)7+

H. Itoh, H. Nonaka, S. Ichimura, 2007 .

Observation of a Si surface sputtered by an ion irradiation system using a prototype compact cluster ion source

H. Nonaka, S. Ichimura, T. Fujimoto, 2007 .

Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study.

H. Jungnickel, A. Luch, B. Hagenhoff, 2021, Analytical chemistry.

HOPG surface irradiated by metal cluster complex ions

M. Ishizuka, H. Nonaka, A. Kushino, 2008 .

Sputtered Si surface irradiated by metal cluster complex ions such as Os3(CO)12 and Ir4(CO)12

H. Nonaka, S. Ichimura, T. Fujimoto, 2007 .

Development of an Ionic-liquid Ion Beam Source for Secondary Ion Mass Spectrometry (SIMS)

N. Saito, Y. Fujiwara, 2014 .