L. M. Queiroz

Diffuse interface modeling for electromigration induced void growth

R. L. De Orio, L. M. Queiroz, 2016, 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro).

Josephson-induced hysteretical behavior of vortex matter in layered BSCCO samples with columnar defects: Bose glass phase and the melting process

E. Raposo, M. Coutinho-Filho, L. M. Queiroz, 2015 .

Monte Carlo simulation of the crossover from Bose glass to Bragg glass phase in layered BSCCO with columnar defects

M. Coutinho-Filho, L. M. Queiroz, 2016, 1609.00558.