A. Benmansour

Failure mechanisms of Trench IGBT under various short-circuit conditions

A. Benmansour, S. Azzopardi, J.C. Martin, 2007, 2007 IEEE Power Electronics Specialists Conference.

Turn-off failure mechanism analysis of Punch Through Trench IGBT under clamped inductive switching operation

A. Benmansour, S. Azzopardi, E. Woirgard, 2007, 2007 European Conference on Power Electronics and Applications.

Effect of the high input capacitance of 1200 V trench IGBT on the switching characteristics under inductive load

O. Briat, A. Benmansour, E. Woirgard, 2005, 2005 European Conference on Power Electronics and Applications.

Assessment of the Trench IGBT reliability: low temperature experimental characterization

A. Benmansour, Stephane Azzopardi, Eric Woirgard, 2005, Microelectron. Reliab..

Failure mechanism of trench IGBT under short-circuit after turn-off

A. Benmansour, Stephane Azzopardi, Eric Woirgard, 2006, Microelectron. Reliab..

Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation

Jean-Yves Delétage, A. Benmansour, Stephane Azzopardi, 2009, Microelectron. Reliab..

Using Phase Change Materials (PCMs) to Reduce Energy Consumption in Buildings

A. Benmansour, I. Bekkouche, R. Bhandari, 2017 .

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions

A. Benmansour, Stephane Azzopardi, Eric Woirgard, 2007, Microelectron. Reliab..

A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation

A. Benmansour, Stephane Azzopardi, Eric Woirgard, 2007, Microelectron. Reliab..

Approche fiabiliste du comportement des canalisations enterrées

A. Benmansour, Abdul-Hamid Soubra, G. Auvinet, 1997 .