Z. Kiss

Non-contact C-V and photoluminscence measurements for More-than-Moore SOI devices

J. Gambino, H. Ziad, T. Frank, 2021, 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production

A. Szabó, J. Veirman, N. Laurent, 2018, Solar Energy Materials and Solar Cells.

Room temperature micro-photoluminescence measurements for monitoring defects in low-energy high-dose As and B implanted silicon

Edward D. Moore, Z. Zolnai, A. Pongrácz, 2021, 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).

Characterization Techniques for Ion-Implanted Layers in Silicon

A. Pongrácz, S. Grasso, M. Polignano, 2018, 2018 22nd International Conference on Ion Implantation Technology (IIT).

Polyaniline: Solutions, Films and Oxidation State

A. Epstein, A. MacDiarmid, Z. Kiss, 1988 .

Photoluminescence for in-line buried defects detection in silicon devices

N. Laurent, D. Cseh, L. Dudás, 2017, 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO).

Single image concept for photoluminescence based emitter saturation current imaging using direct calibration by the QSS-μPCD method

Marshall Wilson, J. Lagowski, Z. Kovács, 2013, 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).

Unified Lifetime Metrology and Photoluminescence Imaging of Passivation Defects for Silicon PV

Piotr Edelman, Valentin D. Mihailetchi, Jacek Lagowski, 2013 .

Detection and characterization of three-dimensional interconnect bonding voids by infrared microscopy

Richard A. Allen, Zoltan Kiss, Gyorgy Nadudvari, 2014 .