Tahira Akber

Elimination of endurance degradation by oxygen annealing in bilayer ZnO/CeO 2-x thin films for nonvolatile resistive memory

D. Bao, K. Mahmood, F. Hussain, 2018, Current Applied Physics.

Transition from unipolar to bipolar, multilevel switching, abrupt and gradual reset phenomena in a TaN/CeO2/Ti: /Pt memory devices

Sungjun Kim, M. Ismail, A. M. Rana, 2019, Materials Research Bulletin.